IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE  
ISSN: 0162-8828    Frecuencia: 12   Formato: Impresa


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16 artículos asociados 
Volumen 30 Número 4 Parte 0 Año 2008

Robust Radiometric Calibration and Vignetting Correction
Kim, Seon Joo; Pollefeys, Marc
Pág. 562 - 576  

Border and SurfaceTracing - Theoretical Foundations
Brimkov, Valentin; Klette, Reinhard
Pág. 577 - 590  

Geometric Rectification of Camera-Captured Document Images
Liang, Jian; DeMenthon, Daniel; Doermann, David
Pág. 591 - 605  

Maximum Confidence Hidden Markov Modeling for Face Recognition
Chien, Jen-Tzung; Liao, Chih-Pin
Pág. 606 - 616  

Image Stitching Using Structure Deformation
Jia, Jiaya; Tang, Chi-Keung
Pág. 617 - 631  

MAC: Magnetostatic Active Contour Model
Xie, Xianghua; Mirmehdi, Majid
Pág. 632 - 646  

Bayes Optimality in Linear Discriminant Analysis
Hamsici, Onur C.; Martinez, Aleix M.
Pág. 647 - 657  

Between Classification-Error Approximation and Weighted Least-Squares Learning
Toh, Kar-Ann; Eng, How-Lung
Pág. 658 - 669  

Dependent Multiple Cue Integration for Robust Tracking
Moreno-Noguer, Francesc; Sanfeliu, Alberto; Samaras, Dimitris
Pág. 670 - 685  

Hole Filling of a 3D Model by Flipping Signs of a Signed Distance Field in Adaptive Resolution
Sagawa, Ryusuke; Ikeuchi, Katsushi
Pág. 686 - 699  

Unsupervised Learning of Discriminative Edge Measures for Vehicle Matching between Nonoverlapping Cameras
Shan, Ying; Sawhney, Harpreet S.; Kumar, Rakesh
Pág. 700 - 711  

Scene Classification Using a Hybrid Generative/Discriminative Approach
Bosch, Anna; Zisserman, Andrew; Muñoz, Xavier
Pág. 712 - 727  

An Improved Physically-Based Method for Geometric Restoration of Distorted Document Images
Zhang, Li; Zhang, Yu; Tan, Chew
Pág. 728 - 734  

Error-Dependency Relationships for the Naïve Bayes Classifier with Binary Features
Kuncheva, Ludmila; Hoare, Zoe
Pág. 735 - 740  

A Rich Discrete Labeling Scheme for Line Drawings of Curved Objects
Cooper, Martin
Pág. 741 - 745  

Robust Foreground Detection In Video Using Pixel Layers
Patwardhan, Kedar; Sapiro, Guillermo; Morellas, Vassilios
Pág. 746 - 751