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Sören Möller, Daniel Höschen, Sina Kurth, Gerwin Esser, Albert Hiller, Christian Scholtysik, Christian Dellen and Christian Linsmeier
The analysis of material composition by ion-beam analysis (IBA) is becoming a standard method, similar to electron microscopy. A pool of IBA methods exists, from which the combination of particle-induced-X-ray emission (PIXE), particle induced gamma-ray ...
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Olga Sánchez and Manuel Hernández-Vélez
ZnOTe compounds were grown by DC magnetron cosputtering from pure Tellurium (Te) and Zinc (Zn) cathodes in O2/Ar atmosphere. The applied power on the Zn target was constant equal to 100 W, while the one applied on the Te target took two values, i.e., 5 W...
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Gonzalo Rincón-Llorente, Irene Heras, Elena Guillén Rodríguez, Erik Schumann, Matthias Krause and Ramón Escobar-Galindo
The optimisation of the specular reflectance of solar collectors is a key parameter to increase the global yield of concentrated solar power (CSP) plants. In this work, the influence of filtered cathodic vacuum arc deposition parameters, particularly wor...
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Henry Wafula, Albert Juma, Thomas Sakwa, Robinson Musembi and Justus Simiyu
Surface photovoltage (SPV) spectroscopy is a powerful tool for studying electronic defects on semiconductor surfaces, at interfaces, and in bulk for a wide range of materials. Undoped and Cobalt-doped TiO2 (CTO) thin films were deposited on Crystalline S...
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