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Huifeng Shi, Xianqiang Liu, Rui Wu, Yijing Zheng, Yonghe Li, Xiaopeng Cheng, Wilhelm Pfleging and Yuefei Zhang
In situ scanning electron microscopy (SEM) offers a good way to investigate the structural evolution during lithiation and delithiation processes. In this paper, the dynamical morphological evolution of 3D-line-structured/unstructured Si/C composite elec...
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