2   Artículos

 
en línea
Satwik Kundu, Rupshali Roy, M. Saifur Rahman, Suryansh Upadhyay, Rasit Onur Topaloglu, Suzanne E. Mohney, Shengxi Huang and Swaroop Ghosh    
The size of transistors has drastically reduced over the years. Interconnects have likewise also been scaled down. Today, conventional copper (Cu)-based interconnects face a significant impediment to further scaling since their electrical conductivity de... ver más
Revista: Journal of Low Power Electronics and Applications    Formato: Electrónico

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