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Jinkun Liu, Run Xu, Yan Zhu, De-Quan Yang, Heng-Yong Nie and Woon Ming Lau
We used atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS) to comprehensively study the growth and the cross-linking of dotriacontane (C32H66) nanofilms that were deposited on a silicon wafer by the spin-coating process. It was foun...
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