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Stylianos Petrakis, Alexandros Skoulakis, Yannis Orphanos, Anastasios Grigoriadis, Georgia Andrianaki, Dimitrios Louloudakis, Nathanail Kortsalioudakis, Athanasios Tsapras, Costas Balas, Dimitrios Zouridis, Efthymios Pachos, Makis Bakarezos, Vasilios Dimitriou, Michael Tatarakis, Emmanouil P. Benis and Nektarios A. Papadogiannis
The rapid growth of nanotechnology has increased the need for fast nanoscale imaging. X-ray free electron laser (XFEL) facilities currently provide such coherent sources of directional and high-brilliance X-ray radiation. These facilities require large f...
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Chun Yang, Chuliang Zhou, Yinghui Zheng, Dongdong Zhang, Jixing Gao, Yafeng Bai, Rong Qi, Jiayi Qian, Jiayan Gui, Zongxin Zhang, Ye Tian and Zhinan Zeng
The electron density profile on a plasma surface has a decisive influence on the mechanism and characteristics of the plasma high-order harmonic generation. When the pre-pulse has a similar spatial and temporal distribution as the main laser pulse, the p...
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Nicola Fabris, Paolo Miotti, Fabio Frassetto and Luca Poletto
A new monochromator with high spectral resolution in the extreme ultraviolet (XUV) has been developed for high-order laser harmonics selection. The system has three optical elements?a cylindrical (or spherical) focusing mirror, a uniform-line-spaced plan...
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R. A. Ganeev, S. Y. Stremoukhov, A. V. Andreev and A. S. Alnaser
Novel methods of coherent short-wavelength sources generation require thorough analysis for their further amendments and practical implementations. In this work, we report on the quasi-phase matching (QPM) of high-order harmonics generation during the pr...
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Linnea Rading, Jan Lahl, Sylvain Maclot, Filippo Campi, Hélène Coudert-Alteirac, Bart Oostenrijk, Jasper Peschel, Hampus Wikmark, Piotr Rudawski, Mathieu Gisselbrecht and Per Johnsson
We report on the design and performance of a velocity map imaging (VMI) spectrometer optimized for experiments using high-intensity extreme ultraviolet (XUV) sources such as laser-driven high-order harmonic generation (HHG) sources and free-electron lase...
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