REVISTA

IEEE TRANSACTIONS ON RELIABILITY

ISSN: 0018-9529 Frecuencia: 4 Formato: Impresa

Tablas de contenido

14 art�culos asociados

Volumen 51 N�mero 1 Parte 0 A�o 2002

Analysis of Stratified Testing for Multichip Module Systems	Solicitud
Park, N. Lombardi, F.
P�g. 100 - 110

Control-Flow Checking by Software Signatures	Solicitud
Oh, N. Shirvani, P. P. McCluskey, E. J.
P�g. 111 - 122

An On-Line BIST RAM Architecture With Self-Repair Capabilities	Solicitud
Benso, A. Chiusano, S. Di Natale, G. Prinetto, P.
P�g. 123 - 128

A Reliability Test-Plan for Series Systems With Components Having Stochastic Failure Rates	Solicitud
Nair, J. H. Sabnis, S. V.
P�g. 17 - 22

Reliability Inferences of Modulated Power-Law Process #i	Solicitud
Muralidharan, K.
P�g. 23 - 26

Parametric Inference for Step-Stress Models	Solicitud
Bagdonavicius, V. B. Gerville-Reache, L. Nikulin, M. S.
P�g. 27 - 31

Distinguishing Between Lognormal and Weibull Distributions	Solicitud
Cain, S. R.
P�g. 32 - 38

Reliability Analysis of Systems With Operation-Time Management	Solicitud
Ramesh, A. V. Twigg, D. W. Sandadi, U. R. Sharma, T. C.
P�g. 39 - 48

Reliability Modeling and Assessment of the Star-Graph Networks	Solicitud
Fitzgerald, K. Latifi, S. Srimani, P. K.
P�g. 49 - 57

A Linear-Time Algorithm for Computing K-Terminal Reliability on Proper Interval Graphs	Solicitud
Lin, M.-S.
P�g. 58 - 62

Error Detection by Duplicated Instructions in Super-Scalar Processors	Solicitud
Oh, N. Shirvani, P. P. McCluskey, E. J.
P�g. 63 - 75

The EFTOS Approach to Dependability in Embedded Supercomputing	Solicitud
Deconinck, G. De Florio, V. Varvarigou, T. Verentziotis, E.
P�g. 76 - 90

Improved Reliability-Prediction and Field-Reliability-Data Analysis for Field-Replaceable Units	Solicitud
Jackson, D. S. Pant, H. Tortorella, M.
P�g. 8 - 16

Effectiveness-Analysis of Real-Time Data Acquisition and Processing Multichannel Systems	Solicitud
Kreimer, J.
P�g. 91 - 99