Resumen
Advanced, superscalar microprocessors (μP" role="presentation" style="position: relative;">????µP
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) are highly susceptible to wear-out failures because of their highly complex, densely packed circuit structure and extreme operational frequencies. Although many types of fault detection and mitigation strategies have been proposed, none have addressed the specific problem of detecting faults that lead to information leakage events on I/O channels of the μP" role="presentation" style="position: relative;">????µP
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. Information leakage can be defined very generally as any type of output that the executing program did not intend to produce. In this work, we restrict this definition to output that represents a security concern, and in particular, to the leakage of plaintext or encryption keys, and propose a counter-based countermeasure to detect faults that cause this type of leakage event. Fault injection (FI) experiments are carried out on two RISC-V microprocessors emulated as soft cores on a Xilinx multi-processor System-on-chip (MPSoC) FPGA. The μP" role="presentation" style="position: relative;">????µP
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designs are instrumented with a set of counters that records the number of transitions that occur on internal nodes. The transition counts are collected from all internal nodes under both fault-free and faulty conditions, and are analyzed to determine which counters provide the highest fault coverage and lowest latency for detecting leakage faults. We show that complete coverage of all leakage faults is possible using only a single counter strategically placed within the branch compare logic of the μPs" role="presentation" style="position: relative;">??????µPs
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.