Resumen
Modern neural networks have made great strides in recognising objects in images and are widely used in defect detection. However, the output of a neural network strongly depends on both the training dataset and the conditions under which the image was acquired for analysis. We have developed a software?hardware method for evaluating the effect of variable lighting on the results of defect recognition using a neural network model. The proposed approach allows us to analyse the recognition results of an existing neural network model and identify the optimal range of illumination at which the desired defects are recognised most consistently. For this purpose, we analysed the variability in quantitative parameters (area and orientation) of damage obtained at different degrees of illumination for two different light sources: LED and conventional incandescent lamps. We calculated each image?s average illuminance and quantitative parameters of recognised defects. Each set of parameters represents the results of defect recognition for a particular illuminance level of a given light source. The proposed approach allows the results obtained using different light sources and illumination levels to be compared and the optimal source type/illuminance level to be figured out. This makes implementing a defect detection environment that allows the best recognition accuracy and the most controlled product quality possible. An analysis of a steel sheet surface showed that the best recognition result was achieved at an illuminance of ~200 lx. An illuminance of less than ~150 lx does not allow most defects to be recognised, whereas an illuminance larger than ~250 lx increases the number of small objects that are falsely recognised as defects.