Resumen
Physical unclonable functions (PUFs) are gaining traction as an attractive alternative to generating and storing device keying material over traditional secure non-volatile memory (NVM) technologies. In this paper, we propose an engineered delay-based PUF called the shift-register, reconvergent-fanout (SiRF) PUF, and present an analysis of the statistical quality of its bitstrings using data collected from a set of FPGAs subjected to extended industrial temperature-voltage environmental conditions. The SiRF PUF utilizes the Xilinx shift register primitive and an engineered network of logic gates that are designed to distribute signal paths over a wide region of the FPGA fabric using a MUXing scheme similar in principle to the shift-rows permutation function within the Advanced Encryption Standard algorithm. The shift register is utilized in a unique fashion to enable individual paths through a Xilinx 5-input LUT to be selected as a source of entropy by the challenge. The engineered logic gate network utilizes reconvergent-fanout as a means of adding entropy, eliminating bias and increasing uncertainty with respect to which paths are actually being timed and used in post-processing to produce the secret key or authentication bitstring. The SiRF PUF is a strong PUF build on top of a network with 10?s of millions of possible paths.