2 Art�culos

Analysis of Work-Function Variation Effects in a Tunnel Field-Effect Transistor Depending on the Device Structure

Acceso

en l�nea

Garam Kim, Jang Hyun Kim, Jaemin Kim and Sangwan Kim

This work can be applied to analyze and reduce the WFV effect of TFETs.

Revista: Applied Sciences Formato: Electr�nico

Tabla de contenido: Vol: 10 Num: 0 Par: 15 A�o: 2020

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