REVISTA

IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE

ISSN: 0162-8828 Frecuencia: 12 Formato: Impresa

Tablas de contenido

10 art�culos asociados

Volumen 22 N�mero 6 Parte 0 A�o 2000

AE Introduction	Solicitud
Bowyer, K
P�g. 553 - 553

Texture Analysis - Exploring Texture Ensembles by Efficient Markov Chain Monte Carlo -- Toward a "Trichromacy" Theory of Texture	Solicitud
Zhu, S C; Liu, X W; Wu, Y N
P�g. 554 - 569

Face and Gesture Recognition - Evolutionary Pursuit and Its Application to Face Recognition	Solicitud
Liu, C; Wechsler, H
P�g. 570 - 582

Computer Vision and Image Analysis - Classification with Nonmetric Distances: Image Retrieval and Class Representation	Solicitud
Jacobs, D W; Weinshall, D; Gdalyahu, Y
P�g. 583 - 600

Computer Vision and Image Analysis - Finding Curvilinear Features in Spatial Point Patterns: Principal Curve Clustering with Noise	Solicitud
Stanford, D C; Raftery, A E
P�g. 601 - 609

Object Recognition - Fast and Globally Convergent Pose Estimation from Video Images	Solicitud
Lu, C-P; Hager, G D; Mjolsness, E
P�g. 610 - 622

SHORT PAPERS - Feature Space Reduction Visualization - Fractional-Step Dimensionality Reduction	Solicitud
Lotlikar, R; Kothari, R
P�g. 623 - 627

SHORT PAPERS - Syntactic and Structural Pattern Analysis - Bayesian Graph Edit Distance	Solicitud
Myers, R; Wilson, R C; Hancock, E R
P�g. 628 - 635

SHORT PAPERS - Document Image Analysis - Precise Candidate Selection for Large Character Set Recognition by Confidence Evaluation	Solicitud
Liu, C-L; Nakagawa, M
P�g. 636 - 641

SHORT PAPERS - Shape Extraction and Representation - Ordering and Parameterizing Scattered 3D Data for B-Spline Surface Approximation	Solicitud
Cohen, F S; Ibrahim, W; Pintavirooj, C
P�g. 642 - 642