REVISTA

IEEE TRANSACTIONS ON RELIABILITY

ISSN: 0018-9529 Frecuencia: 4 Formato: Impresa

Tablas de contenido

25 art�culos asociados

Volumen 47 N�mero 2 Parte 0 A�o 1998

EDITORIALS - Models, models, everywhere, and not a one to use The new-reliability era	Solicitud
Evans, R A
P�g. 105 - 105

FROM THE EDITORS - 50-th Anniversary Celebration	Solicitud

P�g. 106 - 106

FROM THE EDITORS - Tutorial Papers -- Physics & Chemistry of Failure	Solicitud

P�g. 107 - 107

FROM THE EDITORS - Opinion Items	Solicitud

P�g. 107 - 107

COMMENTARY & PERSPECTIVE - Thinking clearly about software-reliability and repairable-systems	Solicitud
Sherwin, D
P�g. 108 - 109

COMMENTARY & PERSPECTIVE - A critique of the Reliability-Analysis-Center failure-rate-model for plastic encapsulated microciruits	Solicitud
Sinnadurai, N; Shukla, A; Pecht, M
P�g. 110 - 113

TUTORIAL & REVIEW - Pitfalls of accelerated testing	Solicitud
Meeker Jr, W; Escobar, L
P�g. 114 - 118

SYSTEM RELIABILITY -- MEASURES, PREDICTION, OPTIMIZATION, ESTIMATION - Reliability life-testing & failure-analysis of GaAs monolithic Ku-band driver amplifiers	Solicitud
Mittereder, J; Roussos, J; Christianson, K; Anderson, W
P�g. 119 - 125

SYSTEM RELIABILITY -- MEASURES, PREDICTION, OPTIMIZATION, ESTIMATION - Predicting system-failure risk from unanticpated fiber-breaks in manufacturing	Solicitud
Kher, S; Bubel, G
P�g. 126 - 130

ACCELERATED TESTING & SCREENING - A new model for step-stress testing	Solicitud
Khamis, I; Higgins, J
P�g. 131 - 134

ACCELERATED TESTING & SCREENING - Accelerated life-testing for micro-machined chemical sensors	Solicitud
Bosc, J; Guo, Y; Sarihan, V; Lee, T
P�g. 135 - 141

ACCELERATED TESTING & SCREENING - Inferences on a simple step-stress model with type-II censored exponential data	Solicitud
Xiong, C
P�g. 142 - 146

MICROCIRCUITS -- DESIGN, PACKAGING, MANUFACTURE, TEST, USE - A metric for estimating the fault-secure behavior of digital circuits	Solicitud
McNamer, M; Kanopoulos, N
P�g. 147 - 154

MICROCIRCUITS -- DESIGN, PACKAGING, MANUFACTURE, TEST, USE - Radiation hardness of static-random-access-memory tested using dose-to-failure and gamma-ray exposure	Solicitud
Chang-Liao, K; Feng, K
P�g. 155 - 158

NETWORK/SYSTEM COMPUTATION & ANALYSIS - Series-parallel reductions in Monte Carlo network-reliability evaluation	Solicitud
Cancela, H; Khadiri, M El
P�g. 159 - 164

NETWORK/SYSTEM COMPUTATION & ANALYSIS - Redundancy optimization for series-parallel multi-state systems	Solicitud
Levitin, G; Lisnianski, A; Ben-Haim, H; Elmakis, D
P�g. 165 - 172

NETWORK/SYSTEM COMPUTATION & ANALYSIS - An implicit method for incorporating common-cause failures in system analysis	Solicitud
Vaurio, J
P�g. 173 - 180

NETWORK/SYSTEM COMPUTATION & ANALYSIS - Continuous-state system-reliability: An interpolation approach	Solicitud
Brunelle, R; Kapur, K
P�g. 181 - 187

DISTRIBUTIONS -- PROBABILITY AND STATISTICAL-INFERENCE - Parameter estimation for the 3-parameter Gamma distribution using the continuation method	Solicitud
Hirose, H
P�g. 188 - 196

DISTRIBUTIONS -- PROBABILITY AND STATISTICAL-INFERENCE - Testing exponentiality of the residual life, based on dynamic Kullback-Lieber information	Solicitud
Ebrahimi, N
P�g. 197 - 201

BOOK REVIEWS - How to Tell the Liars from the Statisticians	Solicitud
Evans, R A
P�g. 202 - 202

FEATURES - Invitation to Membership in the Reliability Society	Solicitud

P�g. 203 - 203

FEATURES - Free Proceedings	Solicitud

P�g. 203 - 203

FEATURES - Manuscripts Received	Solicitud

P�g. 204 - 206

FEATURES - Information for Readers & Authors	Solicitud

P�g. 207 - 207