REVISTA

IEEE TRANSACTIONS ON RELIABILITY

ISSN: 0018-9529 Frecuencia: 4 Formato: Impresa

Tablas de contenido

6 art�culos asociados

Volumen 49 N�mero 4 Parte 0 A�o 2000

Commentary: Reliability-Past, Present, and Future	Solicitud
O Connor, P. D. T.
P�g. 335 - 341

A Gibbs-Sampler Approach to Estimate the Number of Faults in a System Using Capture-Recapture Sampling	Solicitud
Hayakawa, Y. Yip, P. S. F.
P�g. 342 - 350

Prediction Intervals for System Lifetime, Based on Component Test Data	Solicitud
Futatsuya, M.
P�g. 351 - 354

Task-Scheduling Strategies for Reliable TMR Controllers Using Task Grouping and Assignment	Solicitud
Kwak, S. W. Kim, B. K.
P�g. 355 - 362

Fault-Tolerant System Dependability-Explicit Modeling of Hardware and Software Component-Interactions	Solicitud
Kanoun, K. Ortalo-Borrel, M.
P�g. 363 - 376

Lifetime-Characteristics and Inspection-Schemes for Levy Degradation Processes	Solicitud
Yang, Y. Klutke, G.-A.
P�g. 377 - 382